Cryptography Failure analysis SRAM Robustness Neutron DFT Integrated circuit design DPA Cryptographie Delays MEMS Embedded systems BIST Hardware security Hardware SER Microprocessors ATPG Field programmable gate arrays Cross-section Spintronics Heavy ions Memory Crosstalk RSA Security VLSI Sensor Through-silicon vias Estimation Accelerometer Fault tolerance Fiabilité Memories Flip-flops Hardware Trojan Design space exploration Core-cell Power demand Switches Heating Radiation MRAM Modeling Test Memory test Libraries Resistive-open defects Low power Cross section Clocks Integrated circuit testing Integrated circuit modeling Fault modeling AES Design Variability Silicon Soft errors Testing Countermeasures Neutrons Atmospheric neutrons Fault injection Memory device Delay testing Fault attacks Single Event Upset Simulation Low-power design Magnetic tunneling Analytical models Accelerometers Power consumption Circuit faults Electromagnetic Analysis Noise Testability SEU Thermal sensor SoC Random access memory Logic testing FPGA CMOS integrated circuits Automatic test pattern generation Reliability Logic gates Computer architecture Transistors Integrated circuit interconnections Diagnostic Circuit testing Transient faults CMOS Calibration Multiple cell upset MCU Sensors Monitoring Single event upset SEU