In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison

Simone Vincenzo Suraci (1) , Davide Fabiani (1) , Josy Cohen (2)

1 UNIBO - Alma Mater Studiorum Università di Bologna = University of Bologna
2 LFIC (CEA, LIST) - Laboratoire Fiabilité et Intégration de Capteurs (CEA, LIST)

In this paper the aging through high temperature of 10-meter long coaxial cables and its change in electrical properties have been investigated through non-destructive electrical techniques i.e. dielectric spectroscopy and time domain reflectometry. Both techniques allow changes of electrical properties to be revealed with aging, however, the coupling of these two techniques permits an effective cable aging assessment allowing also the recognition of local defects. Indeed, it has been demonstrated that dielectric spectroscopy is more sensitive when the cable is globally aged, while time domain reflectometry, in addition to a global investigation, can also single out aging occurring in limited portion of cable insulation (local aging).

Mots clés: instrumentation; aging; high temperature; cable; non-destructive electrical control; non-destructive testing; dielectric spectroscopy; reflectometry; defect; time domain reflectometry; cable insulation; Diagnosis; onsite measurements; cable diagnostics; lv cables; Fault Location; Coaxial Cable; Changes In Electrical Properties; Impedance; Low Voltage; Measurement Techniques; Power Plants; Dielectric Properties; Nuclear Power Plant; Electric Company; Vector Network Analyzer; Global Aging; Dielectric Measurements; Bulk Measurements; Cable System

Domaines: Instrumentations et Détecteurs [physics.ins-det]; Systèmes et contrôle [cs.SY]

Simone Vincenzo Suraci, Davide Fabiani, Josy Cohen. In situ defect recognition analysis on long cables through nondestructive reflectometry and dielectric spectroscopy methods: a comparison. EIC 2020 - IEEE Electrical Insulation Conference, Jun 2020, Knoxville, United States. pp.41-44, ⟨10.1109/EIC47619.2020.9158583⟩. ⟨cea-04555140⟩